Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications

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dc.contributor.authorDussubieux, Laure
dc.contributor.authorPinchin, Sarah Eleni
dc.contributor.authorTsang, Jia-sun
dc.contributor.authorTumosa, Charles S.
dc.date.accessioned2018-08-31T18:06:29Z
dc.date.available2018-08-31T18:06:29Z
dc.date.issued2005
dc.format.extent766–773
dc.identifier.citationDussubieux, Laure, Pinchin, Sarah Eleni, Tsang, Jia-sun, and Tumosa, Charles S. 2005. "<a href="https://repository.si.edu/handle/10088/43922">Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications</a>." In <em>Preprints of the 14th Triennial Meeting ICOM Committee for Conservation, The Hague, 12-16 September 2005, Volume 2</em>. 766–773.
dc.identifier.urihttps://hdl.handle.net/10088/43922
dc.relation.ispartofPreprints of the 14th Triennial Meeting ICOM Committee for Conservation, The Hague, 12-16 September 2005, Volume 2
dc.titleNon-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications
dc.typechapter
sro.description.unitMCI
sro.identifier.itemID55779
sro.identifier.refworksID9473
sro.identifier.urlhttps://repository.si.edu/handle/10088/43922

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