Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications
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Dussubieux, Laure, Pinchin, Sarah Eleni, Tsang, Jia-sun, and Tumosa, Charles S. 2005. "<a href="https://repository.si.edu/handle/10088/43922">Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications</a>." In <em>Preprints of the 14th Triennial Meeting ICOM Committee for Conservation, The Hague, 12-16 September 2005, Volume 2</em>. 766–773.