Advances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites

Carpenter, P. K.; Zeigler, R. A.; Jolliff, B. L.; Vicenzi, Edward P.; Davis, J. M.; MacRae, C. M.; Wilson, N. C.; Kotula, P. G.; Donovan, J. J.

dc.contributor.author	Carpenter, P. K.	en
dc.contributor.author	Zeigler, R. A.	en
dc.contributor.author	Jolliff, B. L.	en
dc.contributor.author	Vicenzi, Edward P.	en
dc.contributor.author	Davis, J. M.	en
dc.contributor.author	MacRae, C. M.	en
dc.contributor.author	Wilson, N. C.	en
dc.contributor.author	Kotula, P. G.	en
dc.contributor.author	Donovan, J. J.	en
dc.date.accessioned	2018-08-31T18:23:28Z
dc.date.available	2018-08-31T18:23:28Z
dc.date.issued	2009
dc.identifier.citation	Carpenter, P. K., Zeigler, R. A., Jolliff, B. L., Vicenzi, Edward P., Davis, J. M., MacRae, C. M., Wilson, N. C., Kotula, P. G., and Donovan, J. J. 2009. "Advances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites." <em>Microscopy and Microanalysis</em>. 15:534–535. <a href="https://doi.org/10.1017/S1431927609098882">https://doi.org/10.1017/S1431927609098882</a>	en
dc.identifier.issn	1431-9276
dc.identifier.uri	https://hdl.handle.net/10088/73912
dc.relation.ispartof	Microscopy and Microanalysis	en
dc.title	Advances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites	en
dc.type	Journal Article	en
dc.identifier.srbnumber	120946
dc.identifier.doi	10.1017/S1431927609098882
rft.jtitle	Microscopy and Microanalysis
rft.volume	15
rft.spage	534
rft.epage	535
dc.description.SIUnit	Peer-reviewed	en
dc.description.SIUnit	MCI	en
dc.description.SIUnit	si-federal	en
dc.citation.spage	534
dc.citation.epage	535