Advances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites

Carpenter, P. K.; Zeigler, R. A.; Jolliff, B. L.; Vicenzi, Edward P.; Davis, J. M.; MacRae, C. M.; Wilson, N. C.; Kotula, P. G.; Donovan, J. J.

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Advances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites

Carpenter, P. K.;Zeigler, R. A.;Jolliff, B. L.;Vicenzi, Edward P.;Davis, J. M.;MacRae, C. M.;Wilson, N. C.;Kotula, P. G.;Donovan, J. J.

DOI: https://doi.org/10.1017/S1431927609098882

Date: 2009

Citation:

Carpenter, P. K., Zeigler, R. A., Jolliff, B. L., Vicenzi, Edward P., Davis, J. M., MacRae, C. M., Wilson, N. C., Kotula, P. G., and Donovan, J. J. 2009. "Advances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites." Microscopy and Microanalysis. 15:534–535. https://doi.org/10.1017/S1431927609098882

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