Advances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites

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dc.contributor.authorCarpenter, P. K.
dc.contributor.authorZeigler, R. A.
dc.contributor.authorJolliff, B. L.
dc.contributor.authorVicenzi, Edward P.
dc.contributor.authorDavis, J. M.
dc.contributor.authorMacRae, C. M.
dc.contributor.authorWilson, N. C.
dc.contributor.authorKotula, P. G.
dc.contributor.authorDonovan, J. J.
dc.date.accessioned2018-08-31T18:23:28Z
dc.date.available2018-08-31T18:23:28Z
dc.date.issued2009
dc.format.extent534–535
dc.identifier1431-9276
dc.identifier.citationCarpenter, P. K., Zeigler, R. A., Jolliff, B. L., Vicenzi, Edward P., Davis, J. M., MacRae, C. M., Wilson, N. C., Kotula, P. G., and Donovan, J. J. 2009. "<a href="https://repository.si.edu/handle/10088/73912">Advances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites</a>." <em>Microscopy and Microanalysis</em>, 15 534–535. <a href="https://doi.org/10.1017/S1431927609098882">https://doi.org/10.1017/S1431927609098882</a>.
dc.identifier.issn1431-9276
dc.identifier.urihttps://hdl.handle.net/10088/73912
dc.relation.ispartofMicroscopy and Microanalysis 15
dc.titleAdvances in electron-probe microanalysis and compositional mapping: Applications to the analysis of meteorites
dc.typearticle
sro.description.unitMCI
sro.description.unitsi-federal
sro.identifier.doi10.1017/S1431927609098882
sro.identifier.itemID120946
sro.identifier.refworksID33020
sro.identifier.urlhttps://repository.si.edu/handle/10088/73912

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