ChemCam passive reflectance spectroscopy of surface materials at the Curiosity landing site, Mars

Johnson, Jeffrey R.; Bell, J. F.; Bender, S.; Blaney, D.; Cloutis, E.; DeFlores, L.; Ehlmann, B.; Gasnault, O.; Gondet, B.; Kinch, K.; Lemmon, M.; Le Mouélic, S.; Maurice, S.; Rice, M.; Wiens, R. C.; MSL Science Team

ChemCam passive reflectance spectroscopy of surface materials at the Curiosity landing site, Mars

Johnson, Jeffrey R.;Bell, J. F.;Bender, S.;Blaney, D.;Cloutis, E.;DeFlores, L.;Ehlmann, B.;Gasnault, O.;Gondet, B.;Kinch, K.;Lemmon, M.;Le Mouélic, S.;Maurice, S.;Rice, M.;Wiens, R. C.;MSL Science Team

DOI: https://doi.org/10.1016/j.icarus.2014.02.028

Date: 2015

Citation:

Johnson, Jeffrey R., Bell, J. F., Bender, S., Blaney, D., Cloutis, E., DeFlores, L., Ehlmann, B., Gasnault, O., Gondet, B., Kinch, K., Lemmon, M., Le Mouélic, S., Maurice, S., Rice, M., Wiens, R. C., and MSL Science Team. 2015. "ChemCam passive reflectance spectroscopy of surface materials at the Curiosity landing site, Mars." Icarus. 249:74–92. https://doi.org/10.1016/j.icarus.2014.02.028

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