Depth profiling laminated glass with a fiber optic probe customized for adjustable working distance

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dc.contributor.authorMadden, Odile
dc.contributor.authorGordon, Gary
dc.contributor.authorCobb, Kim Cullen
dc.contributor.authorSpencer, Alex M.
dc.date.accessioned2015-04-20T15:15:38Z
dc.date.available2015-04-20T15:15:38Z
dc.date.issued2014
dc.format.extent1318–1321
dc.identifier0377-0486
dc.identifier.citationMadden, Odile, Gordon, Gary, Cobb, Kim Cullen, and Spencer, Alex M. 2014. "<a href="https://repository.si.edu/handle/10088/25411">Depth profiling laminated glass with a fiber optic probe customized for adjustable working distance</a>." <em>Journal of Raman Spectroscopy</em>, 45, (11/12) 1318–1321. <a href="https://doi.org/10.1002/jrs.4550">https://doi.org/10.1002/jrs.4550</a>.
dc.identifier.issn0377-0486
dc.identifier.urihttp://hdl.handle.net/10088/25411
dc.publisherWiley-Blackwell
dc.relation.ispartofJournal of Raman Spectroscopy 45 (11/12)
dc.titleDepth profiling laminated glass with a fiber optic probe customized for adjustable working distance
dc.typearticle
sro.description.unitNASM
sro.description.unitMCI
sro.description.unitNASM-Aeronautics
sro.description.unitsi-federal
sro.description.unitsi-trust
sro.identifier.doi10.1002/jrs.4550
sro.identifier.itemID130897
sro.identifier.refworksID56354
sro.identifier.urlhttps://repository.si.edu/handle/10088/25411
sro.publicationPlaceHoboken

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