Three-Dimensional microanalysis using FIB SEM: Variations in technique

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dc.contributor.authorScott, Keana
dc.contributor.authorDavis, Jeffrey M.
dc.contributor.authorVicenzi, Edward P.
dc.date.accessioned2018-08-31T18:23:28Z
dc.date.available2018-08-31T18:23:28Z
dc.date.issued2009
dc.format.extent476–477
dc.identifier1431-9276
dc.identifier.citationScott, Keana, Davis, Jeffrey M., and Vicenzi, Edward P. 2009. "<a href="https://repository.si.edu/handle/10088/73911">Three-Dimensional microanalysis using FIB SEM: Variations in technique</a>." <em>Microscopy and Microanalysis</em>, 15 476–477. <a href="https://doi.org/10.1017/S143192760909744X">https://doi.org/10.1017/S143192760909744X</a>.
dc.identifier.issn1431-9276
dc.identifier.urihttps://hdl.handle.net/10088/73911
dc.relation.ispartofMicroscopy and Microanalysis 15
dc.titleThree-Dimensional microanalysis using FIB SEM: Variations in technique
dc.typearticle
sro.description.unitMCI
sro.description.unitsi-federal
sro.identifier.doi10.1017/S143192760909744X
sro.identifier.itemID120945
sro.identifier.refworksID80700
sro.identifier.urlhttps://repository.si.edu/handle/10088/73911

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