dc.contributor.author |
Hiebert, Miriam E. |
en |
dc.contributor.author |
Phaneuf, Raymond J. |
en |
dc.contributor.author |
Vicenzi, Edward P. |
en |
dc.date.accessioned |
2018-10-04T02:02:03Z |
|
dc.date.available |
2018-10-04T02:02:03Z |
|
dc.date.issued |
2018 |
|
dc.identifier.citation |
Hiebert, Miriam E., Phaneuf, Raymond J., and Vicenzi, Edward P. 2018. "<a href="https://repository.si.edu/handle/10088/94485">Understanding Effects Responsible for Pinhole Development and Coating Adhesion for Atomic Layer Deposited Coatings on Glass</a>." <em>Microscopy and Microanalysis</em>. 24:2172–2173. <a href="https://doi.org/10.1017/S1431927618011340">https://doi.org/10.1017/S1431927618011340</a> |
en |
dc.identifier.issn |
1431-9276 |
|
dc.identifier.uri |
https://hdl.handle.net/10088/94485 |
|
dc.relation.ispartof |
Microscopy and Microanalysis |
en |
dc.title |
Understanding Effects Responsible for Pinhole Development and Coating Adhesion for Atomic Layer Deposited Coatings on Glass |
en |
dc.type |
Journal Article |
en |
dc.identifier.srbnumber |
148769 |
|
dc.identifier.doi |
10.1017/S1431927618011340 |
|
rft.jtitle |
Microscopy and Microanalysis |
|
rft.volume |
24 |
|
rft.spage |
2172 |
|
rft.epage |
2173 |
|
dc.description.SIUnit |
MCI |
en |
dc.citation.spage |
2172 |
|
dc.citation.epage |
2173 |
|