Three-Dimensional microanalysis using FIB SEM: Variations in technique

Scott, Keana; Davis, Jeffrey M.; Vicenzi, Edward P.

dc.contributor.author	Scott, Keana	en
dc.contributor.author	Davis, Jeffrey M.	en
dc.contributor.author	Vicenzi, Edward P.	en
dc.date.accessioned	2018-08-31T18:23:28Z
dc.date.available	2018-08-31T18:23:28Z
dc.date.issued	2009
dc.identifier.citation	Scott, Keana, Davis, Jeffrey M., and Vicenzi, Edward P. 2009. "Three-Dimensional microanalysis using FIB SEM: Variations in technique." <em>Microscopy and Microanalysis</em>. 15:476–477. <a href="https://doi.org/10.1017/S143192760909744X">https://doi.org/10.1017/S143192760909744X</a>	en
dc.identifier.issn	1431-9276
dc.identifier.uri	https://hdl.handle.net/10088/73911
dc.relation.ispartof	Microscopy and Microanalysis	en
dc.title	Three-Dimensional microanalysis using FIB SEM: Variations in technique	en
dc.type	Journal Article	en
dc.identifier.srbnumber	120945
dc.identifier.doi	10.1017/S143192760909744X
rft.jtitle	Microscopy and Microanalysis
rft.volume	15
rft.spage	476
rft.epage	477
dc.description.SIUnit	Peer-reviewed	en
dc.description.SIUnit	MCI	en
dc.description.SIUnit	si-federal	en
dc.citation.spage	476
dc.citation.epage	477