dc.contributor.author |
Scott, Keana |
en |
dc.contributor.author |
Davis, Jeffrey M. |
en |
dc.contributor.author |
Vicenzi, Edward P. |
en |
dc.date.accessioned |
2018-08-31T18:23:28Z |
|
dc.date.available |
2018-08-31T18:23:28Z |
|
dc.date.issued |
2009 |
|
dc.identifier.citation |
Scott, Keana, Davis, Jeffrey M., and Vicenzi, Edward P. 2009. "Three-Dimensional microanalysis using FIB SEM: Variations in technique." <em>Microscopy and Microanalysis</em>. 15:476–477. <a href="https://doi.org/10.1017/S143192760909744X">https://doi.org/10.1017/S143192760909744X</a> |
en |
dc.identifier.issn |
1431-9276 |
|
dc.identifier.uri |
https://hdl.handle.net/10088/73911 |
|
dc.relation.ispartof |
Microscopy and Microanalysis |
en |
dc.title |
Three-Dimensional microanalysis using FIB SEM: Variations in technique |
en |
dc.type |
Journal Article |
en |
dc.identifier.srbnumber |
120945 |
|
dc.identifier.doi |
10.1017/S143192760909744X |
|
rft.jtitle |
Microscopy and Microanalysis |
|
rft.volume |
15 |
|
rft.spage |
476 |
|
rft.epage |
477 |
|
dc.description.SIUnit |
Peer-reviewed |
en |
dc.description.SIUnit |
MCI |
en |
dc.description.SIUnit |
si-federal |
en |
dc.citation.spage |
476 |
|
dc.citation.epage |
477 |
|