DSpace Repository

Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications

Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications

Dussubieux, Laure;Pinchin, Sarah Eleni;Tsang, Jia-sun;Tumosa, Charles S.
Date: 2005

Citation:

Dussubieux, Laure, Pinchin, Sarah Eleni, Tsang, Jia-sun, and Tumosa, Charles S. 2005. "Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications." in Preprints of the 14th Triennial Meeting ICOM Committee for Conservation, The Hague, 12-16 September 2005, Volume 2, 766–773.

Show full item record

Files in this item

Thumbnail
Name: icom14_134.pdf
Size: 190.3Kb
Format: PDF
Description: Main article
View/Open

This item appears in the following Collection(s)

Search DSpace


Browse

My Account