Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications

Dussubieux, Laure; Pinchin, Sarah Eleni; Tsang, Jia-sun; Tumosa, Charles S.

dc.contributor.author	Dussubieux, Laure	en
dc.contributor.author	Pinchin, Sarah Eleni	en
dc.contributor.author	Tsang, Jia-sun	en
dc.contributor.author	Tumosa, Charles S.	en
dc.date.accessioned	2018-08-31T18:06:29Z
dc.date.available	2018-08-31T18:06:29Z
dc.date.issued	2005
dc.identifier.citation	Dussubieux, Laure, Pinchin, Sarah Eleni, Tsang, Jia-sun, and Tumosa, Charles S. 2005. "<a href="https://repository.si.edu/handle/10088/43922">Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications</a>." in <em>Preprints of the 14th Triennial Meeting ICOM Committee for Conservation, The Hague, 12-16 September 2005, Volume 2</em>, 766–773.	en
dc.identifier.uri	https://hdl.handle.net/10088/43922
dc.relation.ispartof	Preprints of the 14th Triennial Meeting ICOM Committee for Conservation, The Hague, 12-16 September 2005, Volume 2	en
dc.title	Non-destructive elemental analysis: reliability of a portable X-ray fluorescence spectrometer for museum applications	en
dc.type	Book, Section	en
dc.identifier.srbnumber	55779
rft.spage	766
rft.epage	773
rft.btitle	Preprints of the 14th Triennial Meeting ICOM Committee for Conservation, The Hague, 12-16 September 2005, Volume 2
dc.description.SIUnit	MCI	en
dc.citation.spage	766
dc.citation.epage	773