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Analysis of Postage Stamps by Proton-Induced X-Ray Emission Spectrometry

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dc.contributor.author Gill, Thomas E. en_US
dc.contributor.editor Lera, Thomas en_US
dc.contributor.editor Barwis, John H. en_US
dc.contributor.editor Herendeen, David L. en_US
dc.date.accessioned 2013-09-20T17:59:13Z
dc.date.available 2013-09-20T17:59:13Z
dc.date.issued 2013 en_US
dc.identifier.citation Proceedings of the First International Symposium on Analytical Methods in Philately, 83-90. en_US
dc.identifier.uri http://hdl.handle.net/10088/21399
dc.title Analysis of Postage Stamps by Proton-Induced X-Ray Emission Spectrometry en_US
dc.type Chapter en_US
dc.identifier.srbnumber 116896 en_US


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