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Keynote Address: The Place for New Tools in Forensic Philately

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dc.contributor.author Beech, David R. en_US
dc.contributor.editor Lera, Thomas en_US
dc.contributor.editor Barwis, John H. en_US
dc.contributor.editor Herendeen, David L. en_US
dc.date.accessioned 2013-09-20T17:59:01Z
dc.date.available 2013-09-20T17:59:01Z
dc.date.issued 2013 en_US
dc.identifier.citation Proceedings of the First International Symposium on Analytical Methods in Philately, 1-4. en_US
dc.identifier.uri http://hdl.handle.net/10088/21392
dc.title Keynote Address: The Place for New Tools in Forensic Philately en_US
dc.type Chapter en_US
dc.identifier.srbnumber 116889 en_US


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